100 Micron Amorphous Silicon A Si For Various Fields Such As DR Non Destructive Testing

100 Micron Amorphous Silicon A-Si For Various Fields Such As DR And Non-Destructive Testing

3025DA-AG is a light weight detector based on amorphous silicon(a-Si), which is suitable for Non-destructive testing.

Sensor
Receptor Type a-Si

Scintillator Gos / CsI:TI

Active Area 300 x 254 mm

Resolution 2560 x 3072

Pixel Pitch 100 μm

Power Supply & Battery

Adapter In AC 100-240V,50-60Hz

Adapter Out DC 24V,2.7A

Power Dissipation <20 W

Image Quality
Limiting Resolution 3.5 LP/mm

Energy Range 40-160 KV

Dynamic Range ≥84 dB

Sensitivity ≥0.54 LSB/nGy

Ghos <1% 1st frame

DQE 42% @(1 LP/mm)

28% @(2 LP/mm)

MTF 68% @(1 LP/mm)

38% @(2 LP/mm)

20% @(3 LP/mm)

Electricals and interface
A/D Conversion 16 bits

Data Interface Gigabit Ethernet

Frame rate 1x1 5fps/2x2 15fps/3x3 25fps

Exposure Control Free Run/SYNC Acquire

Mechanical
Dimension 384 × 460 × 14.8 mm
Weight 3.4kg

Material Aluminum and magnesium alloys

Front Panel Carbon fiber

Enviromental

Temperature 10-35°C (operating)；-10~50°C (storage)

Humidity 30-70% RH (non-condensing)

Ingress Protection IP51

100 Micron Amorphous Silicon A-Si

DR Amorphous Silicon A-Si

Non-Destructive Testing Amorphous Silicon A-Si

100 Micron Amorphous Silicon A Si For Various Fields Such As DR Non Destructive Testing Images